Materials Scientist Collection

Raman laser spectroscopy C016 / 3827
Raman laser spectroscopy. Researcher observing laser beams and microscope objectives. This LabRAM HR Raman laser spectrometer is being used to obtain phase

X-ray crystallography C016 / 3824
X-ray crystallography. Researcher using an X-ray machine to obtain crystal diffraction patterns of proteins for 3-D imaging of enzymes

FE scanning electron microscopy C016 / 3821
FE scanning electron microscopy. Researcher operating a field-emission scanning electron microscope (FE-SEM). This is a F JEOL 6320F FE-SEM

Scanning transmission electron microscopy C016 / 3815
Scanning transmission electron microscopy. Researcher using a scanning transmission electron microscope (STEM) to analyse the structure of solid-state materials

Micrography metallurgy analysis, 1937 C014 / 0466
Micrography metallurgy analysis. Researcher in the 1930s using a new photomicrograph design (right) to analyse the structural effect of corrosion on metals (left) used in aircraft construction

Glass and ceramics research C016 / 2053
Glass and ceramics research. Researcher pouring out a sample of molten glass during the casting process. This is part of work on ceramic engineering aimed at producing glasses

Silicon cluster manufacturing tool C016 / 3822
Silicon cluster manufacturing tool. Technician working on a silicon cluster tool, used for robotic assembly of silicon devices in a vacuum

X-ray crystallography C016 / 3823
X-ray crystallography. Researcher using an X-ray machine to obtain crystal diffraction patterns of proteins for 3-D imaging of enzymes

Scanning electron microscopy C016 / 3816
Scanning electron microscopy. Researcher using a scanning electron microscope (SEM) to characterize samples of various materials

Atomic processing microscopy C016 / 3817
Atomic processing microscopy. Researcher operating an atomic processing microscope (APM). This device is being used to carry out nanoscale characterization of solid-state materials

Raman scattering analysis C016 / 3812
Raman scattering analysis. Researcher using a laser spectrometer to carry out a Raman scattering characterization analysis on photovoltaic (solar panel) materials

SIMS surface spectroscopy analysis C016 / 3813
SIMS surface spectroscopy analysis. Researcher using a secondary ion mass spectrometer (SIMS) to carry out surface analysis of various samples

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Materials scientists are the unsung heroes of innovation, working tirelessly behind the scenes to unlock the secrets of various substances. Armed with cutting-edge technologies like Raman laser spectroscopy, X-ray crystallography, and FE scanning electron microscopy, they delve into the microscopic world to understand materials at their core. With Raman laser spectroscopy (C016/3827), these scientists use light scattering techniques to analyze molecular vibrations and gain insights into a material's chemical composition. Meanwhile, X-ray crystallography (C016/3824) allows them to determine atomic arrangements within crystals with unparalleled precision. FE scanning electron microscopy (C016/3821) takes their investigations further by providing high-resolution images that reveal surface structures and topography in incredible detail. Similarly, scanning transmission electron microscopy (C016/3815) enables them to visualize even smaller features at an atomic level. In their pursuit of knowledge, materials scientists also employ micrography metallurgy analysis from 1937 (C014/0466). This historical technique helps them understand how metals behave under different conditions and refine manufacturing processes accordingly. Their quest for excellence extends beyond metals as they explore glass and ceramics research (C016/2053). By studying these versatile materials' properties and behavior, they contribute to advancements in fields ranging from architecture to electronics. The work of a materials scientist wouldn't be complete without tools like the silicon cluster manufacturing tool (C016/3822). This technology aids in creating intricate structures on silicon surfaces for applications such as semiconductors or nanotechnology devices. To unravel complex crystalline structures further, X-ray crystallography is employed once again but this time with C016 / 3823 code. The resulting data provides invaluable information about chemical bonding patterns within solids. Scanning electron microscopy continues its reign as one of their go-to methods through C016 / 3816 code.