Solar Energy Research Facility Collection

FE scanning electron microscopy C016 / 3821
FE scanning electron microscopy. Researcher operating a field-emission scanning electron microscope (FE-SEM). This is a F JEOL 6320F FE-SEM

Scanning transmission electron microscopy C016 / 3815
Scanning transmission electron microscopy. Researcher using a scanning transmission electron microscope (STEM) to analyse the structure of solid-state materials

Scanning probe microscopy sample holder C016 / 3820
Scanning probe microscopy sample holder

Scanning electron microscopy C016 / 3816
Scanning electron microscopy. Researcher using a scanning electron microscope (SEM) to characterize samples of various materials

Atomic processing microscopy C016 / 3817
Atomic processing microscopy. Researcher operating an atomic processing microscope (APM). This device is being used to carry out nanoscale characterization of solid-state materials

TOF SIMS spectrometer C016 / 3814
TOF SIMS spectrometer. Time-of-flight (TOF) secondary ion mass spectrometer (SIMS), used to analyse the surfaces of samples of various materials

SIMS surface spectroscopy analysis C016 / 3813
SIMS surface spectroscopy analysis. Researcher using a secondary ion mass spectrometer (SIMS) to carry out surface analysis of various samples

Electro-optical laser characterization C016 / 3811
Electro-optical laser characterization. Femtosecond laser being used to characterize the electrical and optical properties of semiconductor and solid-state materials

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